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Example of a tight field test system

Compact field test system case

Summarize

The tight field system is a far-field test system, but the tight field can achieve better plane wave than the far-field in a shorter distance, and have better static area performance and dynamic range. The tight field system transforms the spherical wave generated by the point source into a plane wave within the near moment away, to realise the far-field test conditions required in the test and to obtain a better quality of the background level of the darkroom by focusing the electromagnetic wave beam.
The tight field system is mainly composed of reflecting surface system, feeder system, turntable system, RF link system and antenna darkroom system.

Client Name A well-known domestic communications equipment manufacturer

Main specifications of the test site:

Darkroom Dimensions:

13m*6m*6m

Frequency:

1700MHz-110GHz

Reflective surface size:

325cm*270cm

Static area size:

170cm*120cm

Amplitude taper:

≤1dB

Range:

±0.4dB

Phase taper:

≤5 degrees

Phase fluctuation:

±4 degrees

Cross-polarisation:

≤-30dB@typical

Typical frequency static area measured data — 1.7GHz,X cut

Amplitude fluctuation: 0.4 dB

Phase fluctuation: 1.4 °

Amplitude taper: 0.8 dB

Phase taper: 1.5 °

Cross-polarisation: ≤-32.0 dB

Typical frequency static area measured data — 2.6GHz,X cut

Amplitude fluctuation: 0.37dB
Phase fluctuation: 1.4 °
Amplitude Taper: 0.8dB
Phase Taper: 2.3 °
Cross-polarisation: ≤-31.0 dB

Typical frequency static area measured data — 33.5GHz,X cut

Amplitude fluctuation: 0.22dB
Phase fluctuation: 1.9 °
Amplitude Taper: 0.6dB
Phase Taper: 0.1 °
Cross-polarisation: ≤-30.0 dB